Scanning electron microscope (SEM) is an electron microscope that produces images of a sample by scanning the surface with a focused electron beam. The electrons interact with the atoms in the sample to produce various signals that contain information about the surface morphology and composition of the sample. The electron beam is scanned with a raster scan pattern and the position of the beam is combined with the detected signal to produce an image. SEM can reach a resolution of more than 1 nanometer, which has been widely used in the field of material analysis and failure analysis.
High magnification; Ultra high resolution; The depth of field; Good fidelity; The sample preparation is simple, the analysis speed is fast, does not damage the sample.
【 structure composition 】
Electronic optical system; Deflection system; Signal collection, detection and amplification system; Image display and recording system; Vacuum system and power supply system.
【 application 】
Observation and analysis of three-dimensional morphology of samples; Composition analysis of sample microzone; Analysis of material fracture; Observe the original surface of the sample directly; Observe the details of each area of the sample; Sample dynamic observation; Widely used in metallurgy, biology, medicine, semiconductor materials and devices, geological exploration, pest prevention and control, disaster (fire, failure analysis) identification, criminal reconnaissance, gemstone identification, industrial production product quality identification and production process control and other fields.